- Parallel Electron Energy Loss Spectroscopy
- Electronics: PEELS
Универсальный русско-английский словарь. Академик.ру. 2011.
Parallel Electron Energy Loss Spectroscopy
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High resolution electron energy loss spectroscopy — (HREELS) is a kind of surface vibrational spectroscopy. A fraction of the incident electrons lose energy by exciting atomic and molecular vibrations at the surface, leading to energy loss peaks that can be observed.Since vibrational energies in… … Wikipedia
Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… … Wikipedia
spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… … Universalium
Electron microscope — Diagram of a transmission electron microscope A 197 … Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
Electron — For other uses, see Electron (disambiguation). Electron Experiments with a Crookes tube first demonstrated the particle nature of electrons. In this illustration, the profile of the cross shaped target is projected against the tube face at right… … Wikipedia
PEELS — Parallel Electron Energy Loss Spectroscopy (Academic & Science » Electronics) … Abbreviations dictionary
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
X-ray spectroscopy — is a gathering name for several spectroscopic techniques for determining the electronic structure of materials by using x ray excitation. X ray emission spectroscopy Karl Manne Georg Siegbahn from Uppsala, Sweden (Nobel Prize 1924), who… … Wikipedia
Rutherford backscattering spectroscopy — Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science. Sometimes referred to as high energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by… … Wikipedia
Atom — The atom is the smallest unit of an element that retains the chemical properties of that element. An atom has an electron cloud consisting of negatively charged electrons surrounding a dense nucleus. The nucleus contains positively charged… … Wikipedia
